Description
MIL DESC 5962-91727 – MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON
Product Details
- Published:
- 01/14/1994
- Number of Pages:
- 23
- File Size:
- 1 file , 1.1 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
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