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JIS Z 4334

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Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

Description

JIS Z 4334 – Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)

Product Details

Published:
01/01/2005
File Size:
1 file , 810 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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