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JIS R 1636

JIS R 1636

Original price was: $52.00.Current price is: $20.00.

Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998

Description

JIS R 1636 – Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer

Product Details

Published:
01/01/1998
File Size:
1 file , 420 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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