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JIS H 0604

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Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1995

Description

JIS H 0604 – Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

Product Details

Published:
01/01/1995
File Size:
1 file , 320 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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