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JIS C 2162

JIS C 2162

Original price was: $75.40.Current price is: $29.00.

Test method of long-term reliability of gate insulator for SiC devices at high temperature
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010

Description

JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature

Product Details

Published:
01/01/2010
File Size:
1 file , 630 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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