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JEDEC JESD51-3

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LOW EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES

Published by Publication Date Number of Pages
JEDEC 08/01/1996 11

Description

JEDEC JESD51-3 – LOW EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES

This standard describes design requirements for a single layer, leaded surface mount integrated circuit package thermal test board. The standard describes board material and geometry requirements, minimum trace lenghts, trace thickness, and routing considerations. Application includes still air and moving air thermal tests.

Product Details

Published:
08/01/1996
Number of Pages:
11
File Size:
1 file , 330 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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