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JEDEC JESD47K

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STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

Published by Publication Date Number of Pages
JEDEC 08/01/2018 34

Description

JEDEC JESD47K – STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

Product Details

Published:
08/01/2018
Number of Pages:
34
File Size:
1 file , 660 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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