Description
JEDEC JEP138 – USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
Product Details
- Published:
- 09/01/1999
- Number of Pages:
- 11
- File Size:
- 1 file , 54 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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