IEC 62373 Ed. 1.0 b

Description

IEC 62373 Ed. 1.0 b – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Product Details

Edition:

1.0

Published:

07/18/2006

Number of Pages:

27

File Size:

1 file , 530 KB

Note:

This product is unavailable in Ukraine, Russia, Belarus