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IEC 60747-5-3 Ed. 1.0 b

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Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods

IEC 60747-5-3 Ed. 1.0 b – Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

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Published by	Publication Date	Number of Pages
IEC	09/05/1997	61